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Hysitron Nanomechanical Applications Lab

Jaroslav Lukeš, Ph.D



Josef Šepitka


The principle of nanoindentation consists in the application of normal force to a diamond tip. The displacement of the probe (penetration depth) is recorded meanwhile. Elastic modulus and microhardness are derived from measured indentation curve (force vs. depth). The intrumented indentation test has become widely used in material science recently. Therefore the ISO standard concentring this technique has been created - ISO 14577 (instrumented indentation test), whitch is respected in our lab as well.

We dispose of nanoindentation system Hysitron TriboIndenterTMTI 950. Our lab has become the official part of nanomechanical research EuroLab of Hysitron, Inc. The instrument is operated by well trained and experienced staff not only for bio application but as well as for applications for material science in general (hard coating, polymers etc.). Please feel free to contact us with any question. We would gladly introduce our system to you and discuss any possible application.

Options of Hysitron TriboIndenterTM

  1. Quasistatic Nanoindentation: Increasing force applied on the tip causes the penetration of the material. The unloading segment is used for the determination of elastic modulus and microhardenss. The dwell segment with constatnt force or displacement can be used for evaluation of creep and relaxation behavior, respectively.
  2. Dynamic Mechanical Analysis (nanoDMA): NanoDMA method is suitable for examination of material with time dependent mechanical characreristic. Harmonic loading is applied on the tip and a harmonic deformation respond is recorded. The output is loss, storage or complex modulus. This method was designed directly for polymers and biomaterials.
  3. Scratch Tests: A scratch test can be performed with our 2D low load transducer. Evaluation of delamination or endurance of coatings can be done. Coefficient of friction and critical force for delamination are the outputs of the analysis.
  4. In-situ Scanning Probe Microscopy imaging (SPM): Very low contact force between the indentation probe and the sample can be maintained while scanning the topography of a sample. Afterwards the indents or scratches can be placed via in-situ SPM image with the positioning <10nm. There is also roughness analysis implented within the software.
  5. Modulus mapping: Modulus Mapping is hybrid technique combining the in-situ SPM capability and nanoDMA method. The map of mechanical properties is visualized as well as the topography of the sample surface.
  6. ScanningWear: While the normal force increases during the in-situ SPM imaging it causes the increase of the volume of removed material with by the diamond tip. Rescanning the sample with low contact force is used for the quantitative analysis of wear parameters afterwards.


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